This technology solution relates to a magnetic recording method and data storage device solution for increasing areal density capability (ADC), drive capacity and write data rate or the number of random write operations per second (Wops) for a hard disk drive device. The invention also helps to manage how to write in data in a hard disk drive to reduce failure rate and improve drive operation lifetime. The solution provide drive capacity gain of shingled magnetic recording (SMR), but without have to pay latency penalty. Please contact us if you are interested in licensing this technology.

Over the past two decades, the human society went through a digitization process, and with increasing data produced an adopted for every aspect of human life. The demand for data storage has not been slow down. As data migrated into cloud to further reduce cost of data storage, the high capacity HDD with large number of platters are being utilized.

However, the scaling of HDD technology leads to a reduction of data temperature capability and increased energy utilized for each bit read/write operations. One of the poor scaling factors is the size/weight of the recording head assembly associated with increasing number of platters per drive. The random access speed is inverse proportional to the weight of the recording head assembly. Traditional stepping motor has to use higher driving current or larger magnet to compensate, which even with increased cost of materials and higher energy consumption, still will lead to slow down of the drive.

IBT has unique magnet design that is able to improve HDD random access speed and lowers the energy consumption of the HDD by up to 20%.

Modern solar panels, power electronic devices and other devices that being applied with high volumetric density, such as HDD utilized in the cloud data center, often experience extreme operation conditions that is outside of assumed operation conditions per manufacture spec. These extreme conditions often accelerate the critical component failure which leads to device failure. IBTSC R&D team has identified a valid solution to help reduce peak temperature on the solar panel surface and electronic device surface, with minimal impact to product cost. This will be an effective approach to reduce failure rate and reduce operation cost.